Adsorption Properties of Porous Silicon Characterized by Optically Enhanced Xe-129 Nmr-Spectroscopy

TitleAdsorption Properties of Porous Silicon Characterized by Optically Enhanced Xe-129 Nmr-Spectroscopy
Publication TypeJournal Article
Year of Publication1995
AuthorsPietrass T., Bifone A., Pines A
JournalSurface Science
Volume334
Issue1-3
PaginationL730-L734
Date PublishedJul 10
ISBN Number0039-6028
Accession NumberWOS:A1995RK97300007
Keywordsfield
Abstract

Highly spin polarized xenon is used to study the adsorption properties of porous silicon surfaces by Xe-129 NMR spectroscopy. The sensitivity enhancement through optical pumping allows the NMR characterization of small amounts of physisorbed xenon in a pressure regime typical for adsorption isotherms. Fully hydrogen terminated porous silicon, porous silicon with an increased number of dangling bonds and porous silicon after methanol adsorption are characterized by the adsorbed Xe-129 NMR lineshape, chemical shift and relaxation behavior.
URL<Go to ISI>://WOS:A1995RK97300007
DOI10.1016/0039-6028(95)80024-7
Short TitleAdsorption Properties of Porous Silicon Characterized by Optically Enhanced Xe-129 Nmr-Spectroscopy
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